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The capacity of various instruments in roughness measurements and analysis is compared. Review of various models of roughness is made and the models of contact mechanics are presented, when taking account the nanometer scale roughness and relating phenomena of adhesion and surface forces. The concept of multi-level models of roughness and contact area is presented. Analysis of surface topography as a spatial pattern is given, when using the approaches of image recognition theory operating with the 3D digital images processing.
The capacity of various instruments in roughness measurements and analysis is compared. Review of various models of roughness is made and the models of contact mechanics are presented, when taking account the nanometer scale roughness and relating phenomena of adhesion and surface forces. The concept of multi-level models of roughness and contact area is presented. Analysis of surface topography as a spatial pattern is given, when using the approaches of image recognition theory operating with the 3D digital images processing.